High brightness halogen light source device

This is a light source device that can observe minute scratches by applying illumination of 400,000Lux (at 30Φ) or more with an illumination light source for scratch inspection of Si wafers and glass surfaces.
1. The sample surface can be illuminated over 400,000Lx.
2. Because the halogen lamp is used as the light source, the color temperature is high, the illuminance unevenness is small, and it is very stable and sharp illumination.
3. The effect of heat is extremely reduced to 1/3 of the conventional aluminum mirror by using a cold mirror.
4. High-intensity observation and low-intensity observation can be performed with one touch by the two-stage switching mechanism.
YP-150I ・・・・・・ Illuminance range: 30mmφ
YP-250I ・・・・・・ Illuminance range: 60mmφ
(For YP-250I, propeller fan type and duct fan type can be selected.)

		YP-150I	YP-250I
Power supply part	Power supply	AC100V 50/60Hz	AC100V（200V） 50/60Hz
	power consumption	About 200W	About 350W
	Lighting method	AC lighting type	DC lighting type
	Light intensity adjustment	Voltage adjustment type
	Total change rate	ｰ	1% MAX (to input, drift, temperature fluctuation)
	Environmental temperature	0～40℃
	cooling method	Natural cooling	Forced fan cooling
	Size	140(W)×94(H)×185(D)mm	135(W)×72(H)×260(D)mm
	Weight	About 2.4 ㎏	About 2 ㎏
	Other	Input code：2.0m Output code：2.5m Foot switch Cord length：3.0m	Input code：2.0m Output code：2.0m （Built-in soft start circuit）（Built-in overcurrent protection circuit）（With digital meter）